Solid-state qubit measurement with single electron transistors

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	Solid-state qubit measurement with single electron transistors
	Jiao, HJ; Li, F; Wang, SK; Li, XQ; Jiao, HJ, Chinese Acad Sci, Inst Semicond, State Key Lab Superlattices & Microstruct, POB 912, Beijing 100083, Peoples R China.
	2008
会议名称	2nd International Workshop on Solid-State Quantum Computing/Mini-School on Quantum Information Science
会议录名称	SOLID-STATE QUANTUM COMPUTING
页码	PROCEEDINGS,1074,: 86-91
会议日期	JUN 23-27, 2008
会议地点	Taipei, TAIWAN
出版地	2 HUNTINGTON QUADRANGLE, STE 1NO1, MELVILLE, NY 11747-4501 USA
出版者	AMER INST PHYSICS
ISBN	978-0-7354-0605-6
部门归属	[jiao, hujun; li, feng; li, xin-qi] chinese acad sci, inst semicond, state key lab superlattices & microstruct, beijing 100083, peoples r china
摘要	In this paper we consider the continuous weak measurement of a solid-state qubit by single electron transistors (SET). For single-dot SET, we find that in nonlinear response regime the signal-to-noise ratio can violate the universal upper bound imposed quantum mechanically on any linear response detectors. We understand the violation by means of the cross-correlation of the detector currents. For double-dot SET, we discuss its robustness against wider range of temperatures, quantum efficiency, and the relevant open issues unresolved.
关键词	Solid-state Qubit Single-electron-transistor Quantum Measurement Number-resolved Master Equation
学科领域	半导体物理
主办者	Natl Sci Council.; Natl Ctr Theoret Sci S.; Natl Ctr Theoret Sci N.; Acad Sinica, Res Ctr Appl Sci.; Natl Cheng Kung Univ.; Ctr Theoret Sci.; Natl Taiwan Univ, Dept Phys.; Natl Taiwan Univ, Coll Sci.
收录类别	CPCI-S
语种	英语
文献类型	会议论文
条目标识符	http://ir.semi.ac.cn/handle/172111/8358
专题	中国科学院半导体研究所（2009年前）
通讯作者	Jiao, HJ, Chinese Acad Sci, Inst Semicond, State Key Lab Superlattices & Microstruct, POB 912, Beijing 100083, Peoples R China.
推荐引用方式 GB/T 7714	Jiao, HJ,Li, F,Wang, SK,et al. Solid-state qubit measurement with single electron transistors[C]. 2 HUNTINGTON QUADRANGLE, STE 1NO1, MELVILLE, NY 11747-4501 USA:AMER INST PHYSICS,2008:PROCEEDINGS,1074,: 86-91.

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